Streamlined microanalysis in the SEM

Gatan instrument used

DigitalMicrograph^® brings together the Monarc^® detector and the EDAX^® Octane Elite EDS system to capture cathodoluminescence (CL) and x-ray signals simultaneously.

Background

Energy dispersive x-ray spectroscopy (EDS) and CL in the scanning electron microscope (SEM) are critical microanalysis techniques in analytical sciences. With EDS, an x-ray fluorescence spectrum reveals a sample’s composition based on characteristic x-rays arising from an element’s atomic structure, whereas CL utilizes optical spectroscopy to reveal optical and electronic properties result from the crystal structure and presence of trace elements or defects. Often, a complete analysis requires characterization using both the EDS and CL techniques. For instance, in many minerals, gems, and cultural heritage items, the CL signal reveals the distribution of specific minor and trace elements at concentrations far below the sensitivity level of EDS.