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Alignment for Emission Patterns

The alignment of the electron beam, cathodoluminescence system, and the sample are critical to capturing emission patterns with meaningful information, plus the highest signal-to-noise ratio and angular resolution. Please refer to the alignment discussion to discover why this step is critical and the steps to take to capture the highest-quality emission patterns.

Image showing how alignment affects emission‑pattern measurements in CL
Go from the quality on the left to the resolution on the right.
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